一种FPGA芯片中DSP模块的内建自测试方法

A New Method of Built-In Self-Test of DSP in FPGAs

提出了一种针对Xilinx Virtex-4/5系列FPGA芯片中嵌入式数字信号处理器(DSP)的内置自检测试(BIST)和故障诊断方法。该方法可以对DSP电路中乘法器和加法器进行有效的测试,缩短测试时间,减少工作量。同时通过更改DSP的配置信息来实现全芯片DSP的功能测试,提高了DSP模块的测试故障覆盖率。

In the paper, a new method of Built-In Self-Test（BIST） for testing and diagnosing the embedded digital signal processors（DSPs） in Xilinx Virtex-4/5 series Field Programmable Gate Arrays（FPGAs） is presented. The method can effectively test the multiplier and adder in the DSP circuit, shorten the test time and reduce the workload. Meanwhile, the function test of the whole chip DSP can be realized by changing the configuration information of the DSP, and the test fault coverage of the DSP module is improved.