整体叶轮在机测量路径规划中的NX二次开发应用

Application of NX Secondary Development in On-machine Measurement Path

在机测量可以避免二次装夹、安装基准变化等因素造成的测量误差,提高测量的准确度。本文基于VS2010和NX8.0平台,对整体叶轮在机测量路径规划模块进行了二次开发。该模块可以根据侧铣加工生成的刀轴轨迹进行直接测量,自动提取其中若干刀轴位置的若干点信息,形成测量轨迹,并输出测量轨迹文件,使误差在方向上具有一致性。若测轴跟相邻的叶片发生干涉,可以计算不发生干涉的角度,通过调整测量角度,避免测量干涉。

On-machine measurement can avoid measurement errors caused by the secondary clamping and the changing of benchmark. So the accuracy of the measurement can be greatly improved. The on-machine measurement path planning module is developed based on NX8.0 and VS2010 platforms,it can automatically extract several point informations of the knife shaft position, generate the measurement trajectories and output the measurement path files. It makes the error on the same direction. If the measuring axis interferes with the adjacent surfaces,the exact interference-free angle can be calculated. Also the adjusted measurement path can be generated.