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电解铜箔毛刺缺陷的成因与对策 被引量:3

Cause analysis on burr defect of electrolytic copper foil and countermeasures
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摘要 电解铜箔生产过程中易产生毛刺缺陷。先分析了毛刺的微观形貌和成分,再结合多年的生产实践经验,从电解液杂质和氯离子含量,溶铜罐中H_2SO_4和Cu^(2+)含量,电流密度,铜箔厚度等方面分析了毛刺产生的原因,并给出了相应的解决措施。 Burr defect is easy to form on electrolytic copper foil during its production process. The microscopic morphology and composition of burr were characterized, and then the causes to burr formation were analyzed from several respects including the contents of impurities and chloride ions in electrolyte, H2SO4 and Cu2+ contents in copper dissolving tank, current density for electrolysis and thickness of copper foil in combination of years of practical production experience. Some countermeasures were given.
作者 董景伟 牛晶晶 樊斌锋 任伟 DONG Jing-wei NIU Jing-jing FAN Bin-feng REN Wei(Lingbao Huaxin Copper Co., Ltd., Lingbao 472500, Chin)
出处 《电镀与涂饰》 CAS CSCD 北大核心 2017年第20期1104-1107,共4页 Electroplating & Finishing
关键词 电解铜箔 毛刺缺陷 铜离子 硫酸 杂质 氯离子 电流密度 electrolytic copper foil burr defect copper ion sulfuric acid impurity chloride ion current density
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