航天器用固态功率放大器加速寿命试验方法研究

Method for accelerating life test of spacecraft solid-state power amplifier

针对航天器电子产品的寿命预示问题,文章指出对航天器电子产品开展加速寿命试验(ALT)研究,首先要利用故障模式、机理及影响分析(FMMEA),确定产品的主要失效机理和敏感应力;然后利用理论分析或可靠性强化试验确定产品的工作极限;最后设计出完整的试验方案。针对航天器固态功率放大器进行试验,验证了加速寿命试验在航天器电子产品中的适用性。

To predict the lifetime of spacecraft electronic products, this paper proposes the accelerated life test（ALT） for those products. Firstly, the failure mode, the mechanism, and the effect analysis（FMMEA） are used to identify the major failure mode, the related mechanism and the sensitive stress. Secondly, the theoretical analysis or the enhanced reliability testing is carried out to obtain the limit of working stress for the product. Finally, the ALT scheme is designed. The spacecraft Solid State Power Amplifier（SSPA） is investigated experimentally to validate the applicability of ALT for the electronic products of spacecraft.