辉光放电质谱法检测高纯硒化镉中的杂质元素

Determination of Impurity Elements in High-purity Cadmium Selenide by Glow Discharge Mass Spectrometry

采用辉光放电质谱法(GDMS)测定了高纯硒化镉粉末中的B、Na、Mg等24种杂质元素。采用铟作为粘结剂,把硒化镉粉末直接压在铟上,考察了样品的制样量对基体信号强度和稳定性的影响。同时对检测过程中产生的多原子离子干扰和多电荷离子干扰进行了确认和排除。3批高纯硒化镉粉末的GDMS检测结果表明,对于小于0.1 mg/kg级别的痕量元素,其相对标准偏差小于20%。与电感耦合等离子体质谱仪(ICP-MS)的结果比对,数据吻合性较好,表明GDMS检测高纯硒化镉具有很好的精密度和准确度。

24 impurity elements in CdSe, such as B , N a, Mg, e tc, were detected by glow discharge mass spectrometry （ GDMS）. CdSe powder was tested by using the indium as the binder,and then the powder was pressed on it,the influence of the amount of CdSe powder on the intensity and stability of the matrix was investigated. Meanwhile, the mass spectrometry interference of multi-atom ions and multi-charge ions appeared during the testing were identified and eliminated too. The GDMS results of the three high-purity CdSe powder showed that for trace elements less than 0. 1 mg/kg,the relative stand deviation （ RSD） was below 20%,and the results were consistent with those obtained by inductively coupled plasma mass spectrometry （ICP-MS）. For the high-purity cadmium selenide testing,GDMS still had good precision and accuracy.