元器件成熟度评价方法及其应用——以FPGA为例

The maturity evaluation method for the electronic component-taking FPGA as example

在分析国外关于元器件成熟度概念内涵的基础上,提出了由制造技术的规范性、功能性能的稳定性和验证的充分性3个方面构成的元器件成熟度评价准则体系。建立了基于信息熵的元器件成熟度评价方法,并以FPGA器件为例,对构建的评价指标体系进行了实证评价,从而验证了方法的有效性。

Based on the analysis of foreign components of maturity concepts,it presents the maturity evaluation method for the electronic component such as the perspective of the production and the verification. Appling to the information entropy,it establishes the evaluation method of the component maturity. Taking FPGA device as an example,it builds the evaluation index system and validates the method.