高层次时序电路可靠度估计方法研究进展

Survey on Reliability Estimation Methods of Sequential Circuit in Height-level

时序电路的可靠性问题日益成为人们关注的焦点。讨论高层次时序电路的可靠性评估方法,重点研究分析了贝叶斯可靠性分析方法、多阶段可靠性分析方法和基于概率转移矩阵的时序电路可靠性分析方法。以ISCAS 89基准电路为实验对象,选择几种典型的高层次时序电路可靠性评估方法进行实验和分析。研究结果和实验结果表明,电路的抽象级别越高,评估方法所获得结果的准确性就越低,评估时间开销越小;同一抽象层次上,不同类型的方法相比,仿真模拟方法的准确性高但时间开销大,解析方法省时但准确性较低。

Reliability of sequential circuits is emerging as an important concern in scaled electronic technologies. In this paper,a survey of the research progress of the high-level reliability analysis for sequential circuits was given. Specially, we focused on Bayesian reliability analysis, multiple-pass reliability analysis and reliability estimation of sequential cir-cuit based on probabilistic transfer matrix. And these analysis methods of sequential circuit were selected for experiment on the ISCAS 89 benchmark circuits. Research results and experimental results show that the abstraction level of circuit is higher,the accuracy of the results is lower,and the time overhead will be less. In the same abstraction level,the simu-lation methods have high accuracy,but also have more runtime,and analytical methods have low time overhead,but less accurate.