薄膜太阳电池器件电学性能测试系统设计

Design of Test System for Electrical Performance of Thin Film Solar Cells

为了实现变温环境下薄膜太阳电池电学性能的自动测试,提出了基于方形四探针法测试原理,采用由工业计算机(IPC)和Keithley 2401数字源表、智能温控仪(SRS13A,SRS14A)组成的主从式控制系统,实现薄膜太阳电池器件的电学性能测试。通过RS-485总线完成智能温控仪与上位机间数据通信,达到对测试环境和样品温度的智能控制。采用GPIB总线实现上位机与Keithly 2401数字源表间的信息交换,获取待测样品的电压、电流、电阻等参数值。基于Lab VIEW开发环境编写的上位机软件被用于完成数据处理,T—R,T—I—U特征曲线的绘制和显示。为了验证该测试系统的性能,对化合物半导体(Zn Te:Cu)薄膜和Cd Te薄膜太阳电池器件的电学性能进行了测试。结果表明,该系统能够完成变温环境下薄膜太阳电池器件电学性能的测试,并且该系统运行可靠、操作简便,能够满足实验室教学和科研的需要。

In order to realize the automatic testing of the electrical properties of thin film solar cells under the changing temperature environment, a test system was proposed based on square four-probe principle. The system is mainly composed of an industrial personal computer （ IPC）, a digital source meter （ Keithley 2401 ） and two intelligent temperature controllers （SRS13A and S RS14A）. The SRS13A and SRS14A are used to control the test temperature and to monitor the real-time temperature of sample and environment. And the RS-485 serial communication protocol is employed to realize the communication between IPC and intelligent temperature controller. Moreover, the Keithley 2401 is used to measure the voltage, current, and resistance of the sample. And the data exchange between IPC and Keithley 2401 is realized via GPIB. The software system developed with LabVIEW is responsible for the drawing of T-R and T-I- U characteristic curve. Finally, in order to verify the performance of the system, the electrical properties testing of a CdTe thin film solar cell and a compound semiconductor （ ZnTe ： Cu） thin film were performed. The results show that the test system can be used to measure the electrical properties of thin film solar ceils under variable temperature environment. And the test system is reliable and easy to operate, which can meet the requirement of teaching and research.