摘要
本文研究了用X-射线荧光光谱仪压片法快速测定矿石中锡含量。试样1．0000g与5．0000g糊精混匀，压制成片，测定电压和电流分别为50kV和70mA。以康普顿散射线为内标，经验系数法校正基体干扰。锡的测定范围（0．005～10×10^-2）。检出限0．002％，相对标准偏差：（0．67～7．1％）。标准物质测定值与国家标准物质推荐值一致，试样测定值与苯萃取一苯芴酮分光光度法和等离子体发射光谱法测定值一致。
A fast method for determination of Tin by XRF was surveyed. The sample （l.0000g） mixed with dextrin （3.0000g）, and pressed powder pellet. The high voltage and electric current was 50kV and 70mA respectively. Compton scattering line was used as the internal standard and empirical coefficients were used for the correction of matrix effect. The measuring range of tin was Sn（0.005 - 10×10^-2）. The detection limit was 0.002%. The relative standard deviation was Sn（0.67-7.1%）. Analytical result was well agreed with the certificated values. The determination results are consistent with those by extraction-spectrophotometry and ICP spectrometry.
出处
《现代科学仪器》
2017年第4期93-98,共6页
Modern Scientific Instruments
