摘要
Nanocrystalline Ti54.5Ni45.5 thin film was prepared by magnetron sputtering followed by rapid thermal annealing. The film displayed martensite structure and （001） compound twin substructure, and the transformation temperatures Ms and As are 313 and 365 K, respectively. The reflectivity for the wavelength from 200 to 800 nm at 298 and 393 K was investigated, and the results showed that the optical reflectivity contrast between martensite and austensite at 780, 650, 514 and 405 nm was 105.64, 170.83, 112.22 and 149.92%, respectively, which were larger than those of other reported optical recording materials.
Nanocrystalline Ti54.5Ni45.5 thin film was prepared by magnetron sputtering followed by rapid thermal annealing. The film displayed martensite structure and （001） compound twin substructure, and the transformation temperatures Ms and As are 313 and 365 K, respectively. The reflectivity for the wavelength from 200 to 800 nm at 298 and 393 K was investigated, and the results showed that the optical reflectivity contrast between martensite and austensite at 780, 650, 514 and 405 nm was 105.64, 170.83, 112.22 and 149.92%, respectively, which were larger than those of other reported optical recording materials.
基金
supported by the National Natural Science Foundation of China (Nos.51471061 and 51601126)
the Program for New Century Excellent Talents in University of Ministry of Education of China (No.NCET-12-0160)
