自愈式电容器加速电老化试验及寿命估计

Accelerated Electrical Aging Experiment of Self-healing Capacitor and Its Lifetime Evaluation

自愈式电容器的电老化过程伴随着电容下降,无法满足无功补偿对其要求时会影响电力系统的正常运行。为探究自愈式电容器电老化过程中电容值下降规律,并据此推断其工作寿命,在环境温度下针对自愈式电容器元件开展了试验电压为额定电压的1.0、1.2、1.4和1.6倍,加压时间为1 000 h的加速电老化试验,测量了试验过程中的电容值变化量。分析了施加电压对电容值下降速度的影响;并根据以上数据预估电容器在电老化下的寿命。试验结果表明:随着电压增加电容值下降量迅速增大,近似成幂函数增加;由加速电老化试验数据并结合电老化经验公式可以初步估算电容器电老化寿命,为自愈式电容器电老化及寿命预估提供参考。

The electrical aging of self-healing capacitor causes the decrease of capacitance. It will affect the normal operation of the power system when the self-healing capacitor couldn't meet the requirements of reactive power compensation. To study the self-healing capacitor's capacitance drop during electrical aging process and lifetime,its elements are tested at ambient temperature and 1. 0,1. 2,1. 4 and 1. 6 times rated voltage for about1 000 h. During the test,their capacitance was measured. According to the recorded data,the influence of the applied voltage was investigated on the falling speed of the capacitance and estimate the lifetime of the capacitor.Test results show that the capacitance decreases exponential with the increase of the applied voltage. The aging lifetime of the capacitor can be estimated by the accelerated aging test data and the empirical formula. A reference is provided for the electrical aging and lifetime evaluation of self-healing capacitors.