摘要
本文采用背散射电子衍射 (EBSD)及透射电镜 (TEM)技术对拉伸变形单晶铝 ([110 ]方向平行于拉伸轴 )的显微组织进行了表征 ,直接对比了两种分析手段所得结果的异同。结果发现 ,单晶铝形变显微组织中表现为明显的带状特征 ,TEM及EBSD技术的表征结果非常吻合 ,但EBSD不能完全反映出位错界面的分割特征 ;相对于TEM而言 ,EBSD技术所能分析的试样区域较大 。
Tensile deformation microstructure of aluminum single crystal was characterized by TEM and EBSD techniques. The obtained results showed that band like deformation microstructure can be revealed by both of them. TEM is suitable for characterization of the dislocation boundary subdivision. EBSD technique can give preferable statistical results due to its large examination area as compared with TEM.
出处
《电子显微学报》
CAS
CSCD
北大核心
2002年第4期449-454,共6页
Journal of Chinese Electron Microscopy Society
基金
国家自然科学基金资助项目 (No .5 970 10 11)~~
