雷电对计算机内部电磁环境影响的模拟研究

Simulation of Influence of Lightning on Internal Electromagnetic Environment of Computer

用XFDTD软件模拟计算了雷电电场强度为50 k V,上升沿约为50 ns,脉宽为2 000 ns的强雷电电磁脉冲与台式计算机耦合后,机箱内几个典型位置处的耦合电场随时间变化的曲线和能量密度随时间变化的曲线;分析了计算机内部不同位置处的屏蔽效能。耦合产生的能量密度的峰值和对计算机系统造成损害的电磁脉冲功率密度的阈值相对比,得出机箱内耦合产生的能量不能影响计算机的正常工作,但在孔洞处耦合产生的能量很大,仿真结果为计算机的雷电电磁兼容设计提供了参考依据。

Through XFDTD software simulating electric field strength, rising edge about 50ns, strong lightning electromagnetic pulse of 5OKV lightning and pulse width about 2000ns coupled with a desktop computer, the curves of the coupled electric field with time and the curves of the energy density with time at several typical locations in the chassis are obtained; the shielding effectiveness of different locations inside the computer is analyzed. Simulation results suggest that the electromagnetic field strength produced in the chassis has no damage to the computer node while coupling energy generated in the hole is large in comparison with the threshold electromagnetic pulse power density, which provides a reference for EMC design of portable computer.