玻璃绝缘子积污微观特性研究

Study on the Microstructure Characteristics of Natural Contamination Deposit on Glass Insulator Surface

绝缘子表面的污秽物是导致闪络的重要因素之一。采用SEM结合EDS元素分析技术对于广州典型区域玻璃绝缘绝缘子的污秽沉积性质展开了测试研究,研究结果表明:玻璃绝缘子表面积污微观结构具有层次结构,积污量呈径向减小趋势,并呈现不规律性分布;污秽主要由难溶物组成,不同区域的难溶物组成基本接近,且在径向方向没有大幅度变化;污秽中钙元素的相对含量沿径向升高,钠元素相对含量在径向方向减小。

Contamination of insulator surface is one of the important factors causing flashover acci- dents. So this article focus on microstructure characteristics of insulator natural contamination in Guang- zhou based on the experimental data of SEM and EDS element analysis. Test results indicate that the mi- crostructure of deposition has a hierarchical structure and radial decreasing trend, irregular distribution; contamination is mainly composed of insoluble material which did not change significantly in the radial di- rection, the insulator insoluble contamination of different areas appears nearly uniform composition. Meanwhile the relative content of calcium is increased along the radial direction and the relative content of sodium decreased in the radial direction.