摘要
基于X射线激光脉冲短、单色性好、能量高而且相干程度高的优点,本文从理论上提出X射线激光干涉用于对晶体结构及缺陷的测量。由于X射线激光波长量级为10^(-10) m,因此可实现高精密测量。此外,本文给出了X射线激光测量晶体的装置、缺陷晶体的测量模型和晶体参量的测量模型。
Based on the advantages of short X-ray laser pulse,excellence monochromaticity, high energy and superior coherence,X-ray laser interferometry is proposed to measure crystal structures and defects in this paper. As the X-ray laser apparatus wavelength of the order of 10-10m,high-precision measurement can be realized. In addition, X-ray laser measurement of crystal devices system, defective crystal measurement model and crystal parameter measure- ment model are provided in this paper.
出处
《光散射学报》
北大核心
2017年第4期372-375,共4页
The Journal of Light Scattering
关键词
X射线激光
干涉
精密测量
模型
X-ray laser
interference
high-precision measurement
model
