K值法测定工业硅粉中二氧化硅的含量

The Determination of Silicon Dioxide Content in the Industrial Silicon Powder by K-value Method

采用X射线K值法测定工业硅粉中二氧化硅的含量,结果表明,使用X射线K值法对工业硅粉中二氧化硅进行定量相分析,可计算得出工业硅粉中二氧化硅的含量,能对工业硅粉中硅石掺假现象进行监督防治,是一种切实有效的检测方法。

The X-ray K-value method is adopted for the determination of silicon dioxide content in industrial silicon powder, the results show, the quantitative phase analysis is processed for the silicon dioxide in industrial silicon powder by X-ray K-value method, therefore, the silicon dioxide content in the industrial silicon powder can be calculated, which can supervise and prevent the silica adulteration in the industrial silicon powder, which is a practical and effective detection way.