摘要
本文采用冷却速度试验、温度回升试验对BC-35A半导体冷藏箱进行了故障分析。结果表明,半导体冷藏箱冷藏温度不合格的主要原因是制冷片的导热硅脂粘贴不牢固,并通过更换半导体制冷片对故障冰箱进行了修复。
In this paper, the cooling speed test and temperature rise test are adopted to analyze the malfunction of BC -35A semiconductor refrigerator. The results show that the main reason of semiconductor refrigerator' s freezer temperature unqualified is that the thermal conductive silicone wasn' t pasted strong, and by changing the semicon- ductor refrigeration sheet to repair failure refrigerator.
出处
《日用电器》
2017年第12期27-29,共3页
ELECTRICAL APPLIANCES
关键词
半导体冷藏箱
冷藏温度
故障分析
semiconductor refrigerator
freezer temperature
malfunction analysis