一种用于ZnS(Ag)闪烁法总α、β测量的同向反符合方式

A Anti-coincidence System for Measuring Total α and β Using ZnS(Ag) Scintillation Method

提出一种用于ZnS(Ag)闪烁法总α、β测量的同向反符合方式,搭建试验系统并对本底、效率比、效率稳定性、串道比及样品总α、β测量进行了实测,结果表明该同向反符合系统能够用于低本底α、β测量,并且相对于传统反符合方式,该方式结构更加严密、降低了仪器成本、安装方便、便于运输,并且对于基于闪烁法低本底β-γ符合方法的应用能够提供全新的思路。

A new anti-coincidence system was proposed for measuring total aandp u s ing ZnS （ A g ）Scintillation and the test, device was set up. The background count., efficiency and interfere ratio testing results showed that, this system can be used for low background a and p meas-urement. equipment. The system is tighter in structure, low e r in cost, an d e a s ie r in t ra n s p o r ta t io n an d in -stallation ,and provide a new way for ^ - Y anti-coincidence measurement, with low background scintilla-tion method.