基于步进扫描傅里叶变换的红外光致发光研究

Infrared Photoluminescence Spectroscopy with a Step-scan Fourier-transform Infrared Spectrometer

搭建了红外波段的傅里叶变换光致发光谱测试系统,结合FTIR光谱仪的步进扫描功能,在室温条件下对短波和中波碲镉汞材料进行了光致发光测试。测试结果表明,相对于常规的连续谱扫描,步进扫描的方式成功地抑制了背景辐射的影响,同时还显著提高了PL谱信号的信噪比,在室温下获得了光滑的PL谱曲线。

An infrared photoluminescence （PL） measurement system was set up based on the Fourier-transform infrared spectrometer with step-scan mode. PL measurements of two HgCdTe thin films with cut-off wavelengths at short-wavelength and middle-wavelength were tested with the step-scan mode and conventional continuous-scan mode at room temperature. The measurement results with the step-scan mode indicated that the thermal background emission disturbance can be reduced, and the signal-to-noise ratio of the PL signal was significantly improved; hence, a rather smooth PL spectrum was obtained for the HgCdTe samples.