摘要
介绍了基于EMMI的GaAs数字电路失效分析方法,并以一款24位串转并驱动器芯片输出端电平不能翻转的失效模式为案例,通过该方法找到了芯片互联层之间短路的故障。从该案例可以看出,基于EMMI的GaAs数字电路失效分析方法具有定位精确、高效快速的优点,可以为提升GaAs数字电路可靠性提供有力的技术支持,值得广泛应用。
A failure analysis method of GaAs digital circuit based on EMMI was presented in this paper,by which the failure mechanism was explored for a 24-bit driver chip with output erroneous reverse.By the method,the short circuit fault in chip interconnection layers was found accurately.It is shown that the EMMI method has the advantages of fast and accurate location of failure site,which can provide powerful technical support for the improvement of GaAs digital circuit reliability.In conclusion,the failure analysis method of GaAs digital circuit based on EMMI is worthy of wide applications.
出处
《固体电子学研究与进展》
CSCD
北大核心
2017年第6期424-428,共5页
Research & Progress of SSE
