利用ICP-AES分析光学玻璃中的结石

ICP-AES Analysis on Stone in Optical Glass

结石是高品质光学玻璃中的一种严重缺陷,分析光学玻璃中结石组分及结石产生原因是消除这种缺陷的关键。结合玻璃生产熔炉及组成等实际,利用电感耦合等离子体原子发射光谱仪(ICP-AES)分析不同体系玻璃中结石的图谱。结果表明:和以前使用的光学显微镜方法相比,利用电感耦合等离子体原子发射光谱仪(ICP-AES)可以对结石的成分进行快速分析,通过与基体玻璃相比对,有助于准确推测出结石产生的可能原因,为消除玻璃中的结石缺陷提供了依据。

Stone is a serious defect in high quality optical glass. Analyzing the composition of stones in optical glass and the generating cause is the key to eliminate this defect. Taking glass production furnace, the composition and other physical truth into account, we analyze the spectrums of stones in different glass systems using Inductively Coupled Plasma-Atomic Emission Spectrometry （ ICP- AES） . The results suggest that we can make rapid analysis on composition of stones by ICP-AES compared to previous methods using optical microscope. Moreover, we can speculate the generating cause of stones accurately through comparative tests with substrate glass, providing evidence for eliminating stone defects in glass.