介质材料内部充电特性模拟仿真与试验研究

Simulation and Investigation of Deep Charging Characteristic for Dielectric Material

针对星用介质材料的深层充电效应问题,基于高能电子在介质材料中的传输模型,仿真分析了介质材料在不同深度处的电荷沉积,分析了介质中叠合的金属层厚度和层数对电荷沉积的影响。基于仿真结果设计了平板型多层结构的测试系统,利用加速器辐照试验,分析了电子辐照后的电荷沉积情况,并与仿真结果进行了对比分析。结果表明,8层叠加的多层结构能有效地得到介质深层的电荷沉积分布特性。本文研究结果可直接应用于空间辐射效应监测载荷中。

According to the deep charging problem of dielectric material,based on high energy electron transfer model in the dielectric material,the charge deposition at different depths of the dielectric material was simulated and analyzed.The effect of the thickness of the metal layer and the number of layer in the dielectric on charge deposition was analyzed.Based on the simulation result,a test system of a plate-type multilayer structure was designed.The charge deposition test was analyzed by accelerator irradiation test,and the results were compared with the simulation results.The results show that the multilayer structure of 8 layers can effectively obtain the charge deposition distribution characteristic of the deep charge of the dielectric.The results of the study can be directly applied to the space radiation effect monitoring load.