摘要
根据电荷转移效率的测试原理,基于宇宙射线高能粒子入射对CCD图像的影响,提出了一种基于高能粒子入射产生亮线的CCD电荷转移效率计算方法,对高能粒子入射产生的12条瞬时亮线进行了计算分析,获得了一致性较好的CCD电荷转移效率。该方法可实时评价电荷耦合器件的在轨性能,对预测CCD成像性能退化情况和使用寿命都具有重要意义。
According to the testing principle of charge transfer efficiency,a method for calculating charge transfer efficiency of charge-coupled devices(CCD)is presented based on the bright lines in the images of CCD produced by high energy particles from cosmic rays.Then,the 12 bright lines are analyzed,and the corresponding charge transfer efficiency has been given with good agreement.The method presented in this paper is of great significance for real-time evaluation of the on-orbit performance of CCD,and it is also important for prediction of the degradation of the imaging performance and the lifetime of CCD.
出处
《现代应用物理》
2017年第4期28-31,共4页
Modern Applied Physics
关键词
宇宙射线
高能粒子
电荷耦合器件
电荷转移效率
cosmic rays
high energy particle
charge-coupled devices
charge transfer efficiency
