基于电信智能卡芯片应用场景的闪存耐久力测试方法

FLASH endurance test method based on the application scenario of telecom smart card chip

半导体制造工艺不断发展和特征尺寸缩小给闪存可靠性带来挑战。闪存可靠性测试与评价越来越重要。闪存可靠性测试是智能卡芯片可靠性测试中的关键测试。本文介绍了电信智能卡芯片在应用场景下的闪存耐久力测试方法。

dimension technology card based The FLASH reliability is challenged by semiconductor manufacture technology development and critical reduction. The FLASH reliability test is very important The FLASH reliability test is the important in the smart card reliability test. This paper introduces the FLASH endurance test method of telecom smart on application scenarios system