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高速光耦瞬态共模抑制性能的电路仿真方法 被引量:4

Circuit simulation method for testing common mode transient immunity of high-speed optocoupler
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摘要 为了解决高速光电耦合器的瞬态共模抑制不能准确测试的问题,研究了光耦的耦合机理和瞬态共模抑制的测试原理。利用仿真技术对电路功能及瞬态共模抑制评估电路的耦合参数(包括耦合电阻与耦合电容)进行仿真和验证,分析了电路中的不同器件参数对仿真结果的影响,并且对得到的输出波形的数据进行读取与分析。以HCPL-2611为例,使用大电阻和小电容并联的模型模拟实际中的耦合情况,通过仿真分析确定了耦合电容的大小,验证了高速光耦瞬态共模抑制仿真方法的有效性。 To resolve the problem that the common mode transient immunity(CMTI)of high-speed optocoupler cannot be accurately tested,the coupling mechanism of the optocoupler and the testing principle of CMTI are researched. The simulation technology is adopted to simulate and verify the circuit function and coupling parameters(including coupling resistance and coupling capacitance)of the CMTI evaluation circuit. The effects of different device parameters in the circuit on simulation results are analyzed,and the obtained data of output waveforms is read and analyzed. Taking HCPL-2611 as an example,the model of parallel connection of large resistance and small capacitance is adopted to simulate the coupling condition in practice. The size of coupling capacitance is determined and the effectiveness of high-speed optocoupler CMTI is verified by means of simulation analysis.
出处 《现代电子技术》 北大核心 2018年第4期60-64,共5页 Modern Electronics Technique
基金 国家自然科学基金(61376042)~~
关键词 瞬态共模抑制 PSPICE仿真 高压脉冲 耦合参数 耦合电阻 耦合电容 common mode transient immunity PSpice simulation high-voltage pulse coupling parameter coupling resistance coupling capacitance
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