利用红外热像技术检测劣化绝缘子的适用性分析研究

Study on the Applicability of Detecting Deterioration Insulator Based on Infrared Thermal Image

文中针对某500 k V变电站发现的低零值绝缘子缺陷进行了红外热相技术检测劣化绝缘子的适用范围研究,分析了各个电压等级的盘形绝缘子串中电压分布规律,对劣化绝缘子在不同阻值、不同位置下的发热情况进行了计算,给出测试盲区的范围和改善方法。现场测试表明,该方法使红外热像技术在适用范围内检出劣化绝缘子的概率明显提高。

This paper introduces a way of detecting zero and low resistance insulators defects in a 500 k V substationand studies the applicability of infrared thermal image technology used in deterioration insulator test area. The volt-age distribution of the insulator strings among various voltage levels are analyzed,the heat produced by the deteriora-tion insulators under different resistance and location are calculated,the boundary of blind zone of detection and anew field test method are proposed. Practical tests show that the new method make the success rate of detection basedon infrared thermal image technology improve remarkably in its applicable range.