一种晶圆MAP图自动提取及合并的方法研究

A Method of Automatically Extracting and Merging Wafer MAP Graphs

晶圆MAP是对WAFER中各个DIE的测试结果,按照每个DIE的坐标位置在图中标注出来,从而形成一张测试MAP。随着芯片设计的发展,不少复杂的SOC芯片设计厂家会购买成熟的IP,而相应的测试也会分开进行,在封装前需要把不同地方的测试MAP合并起来,形成最终的封装MAP图。本文介绍了如何利用EXCEL的宏功能实现测试数据的自动提取及合并,在大大提高ATE测试工程师处理晶圆MAP效率的同时,避免了人为因素介入引起的出错概率。

Wafer MAP is a test result of each DIE in WAFER,and the coordinate position of each DIE is marked in the figure to form a MAP？ With the development of chip design,many complicated SOC chip design manufacturers will purchase mature IP,and the corresponding tests will be carried out separately？ Before the package,the test MAPS in different places need to be combined to form the final package MAP？ This article describes how to use EXCEL macros to automatically extract and merge test data,which can greatly improve ATE test engineer＇s efficiency of processing Wafer MAP while avoiding the error probability introduced by human intervention？