基于STM32与图像采集模块OV5640的物品表面缺陷检测仪设计

Design of Surface Defect Detector Based on Stm32 and Image Acquisition Module OV5640

针对物品表面缺陷检测所面临的缺陷区和非缺陷区之间的低对比度、噪音与细微缺陷的相似度、检测偏慢和识别度较低等问题,设计了一种以STM32与OV5640为核心的便携式物品表面缺陷检测仪。本设计采用图像采集模块OV5640对物品表面快速帧扫描,将采集到的数据通过DMA方式传送给STM32F429存储,然后STM32F429对图像数据进行采样、频谱算法实现、结果提取等处理,最后将处理完的数据送液晶显示屏显示,并实现语音播报是否有缺陷。实验测试表明,这个设计可用于检测物品表面的污点、划痕、线与阴影等缺陷,其具有稳定性好、操作简便、处理速度快、实时性好等特点。

Problems of low contrast,noise and minor defects,slow detection and low identification of defects in the defect area and non-defect areas faced by the defect detection of objects,designed a kind of STM32 and OV5640 as the core of the portable items surface defect detector. This design adopts the image acquisition module OV5640 fast frame scanning,on the surface of a goods will be collected data through DMA transfer to STM32 F429 storage,then STM32 F429 algorithm for image data sampling,spectrum,extracting result of processing,the processed data will be sent to the LCD display shows,and realize the speech is flawed. This design adopts the image acquisition module OV5640 fast frame scanning,on the surface of a goods will be collected data through DMA transfer to STM32 F429 storage,then STM32 F429 algorithm for image data sampling,spectrum,extracting result of processing,the processed data will be sent to the LCD display shows,and realize the speech is flawed.