期刊文献+

DSP大气中子单粒子效应试验研究 被引量:6

Experimental Investigation of DSP Single Event Effect Caused by Atmospheric Neutron
下载PDF
导出
摘要 利用14Me V快中子辐照源,开展了数字信号处理器(DSP)大气中子单粒子效应地面模拟试验研究。设计了地面模拟的试验方法,包括单粒子效应监测方法、试验系统布局、试验程序及其判据等。获得了SMJ320F2812、SMJ320C6415、TMS320C6416、TMS320C6418等多款型号DSP器件的中子单粒子效应的翻转错误数试验数据,分析计算得到14Me V中子辐照源下的敏感截面。结果显示,DSP器件的主要敏感现象为单粒子翻转(SEU),部分器件还发生了单粒子功能中断效应(SEFI)。相同工艺的被测DSP器件的中子单粒子效应敏感截面具有相同的数量级,验证了本文使用的地面模拟试验方法的可行性,为航空电子设备的可靠性与安全性评估提供了大气中子单粒子效应的器件级基础数据。 The research of the sensitive property of Digital Signal Processor (DSP) single event effect under the atmospheric neutron radiation environment was carried out based on the 14Mev neutron radiation source in this paper. An experiment scheme on ground was designed including detection, experimental setup, testing procedure and criterion of the single event effect caused by atmospheric neutron. Different types of DSP, such as SMJ320F2812, SMJ320C6415, TMS320C6416, TMS320C6418, were used in the test. The results of the Single Event Upset (SEU) were acquired and then the cross section was calculated. The results show that the main sensitive phenomenon is single event upset, Single Event Function Interrupt (SEFI) occurred in some devices. The devices with the same feature size have the same order of the cross section magnitude, validating the feasibility of the experimental method. The results provide the basic data to evaluate the reliability and security of the avionic electronic equipments.
出处 《航空科学技术》 2018年第2期67-72,共6页 Aeronautical Science & Technology
关键词 数字信号处理器 大气中子 单粒子翻转 敏感截面 单粒子功能中断 DSP atmospheric neutron sensitive cross section SEU SEF
  • 相关文献

参考文献4

二级参考文献37

  • 1仲启平,陈雄军,卢涵林,赵文荣,于伟翔.伴随粒子法测量T(d,n)~4He中子源注量率中的本底处理[J].原子能科学技术,2005,39(2):130-133. 被引量:8
  • 2Dodd P E, Massengill L W. Basic mechanisms and modeling of single event upset in digital microelectronics[J]. IEEE Trans on Nucl Sci, 2003, 50(3) :583 602.
  • 3Karnik T, Hazucha P, Patel J, et al. Characterization of soft errors caused by single event upsets in CMOS processes[J]. IEEE Trans on Dependable and Secure Computing, 2004, 1(2) :128-142.
  • 4Armani J M, Simon G, Poirot P, et al. Low-energy neutron sensitivity of recent generation SRAMs[J]. IEEE Trans on Nucl Sci, 2004, 51 (5) :2811-2816.
  • 5Lambert D, Baggio J, Ferlet-Cavrois V, et al. Neutron-induced SEU in bulk SRAMs in terrestrial environment: simulations and experiments [J]. IEEE Trans on Nucl Sci, 2004, 51(6):3435-3441.
  • 6乔登江.电子元器件抗辐射加固技术[M].西安:西北核技术研究所,2002.
  • 7西北核技术研究所第九研究室.西安脉冲反应堆中子辐射用户手册[z].西安:西北核技术研究所,2006.
  • 8IEC/TS 62396 Partl-2006, Process management for avionics- Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment[S].
  • 9Ken Vranish, KVA Engineering. Atmospheric Radiation Effects Whitepaper: The Growing Impact of Atmospheric Radiation Effects on Semiconductor Devices and the Associated Impact on Avionics Suppliers[EB/OL]. 2007. http ://www.kva-engineering.com/ pdf/SEU.Whitepaper_FAA_Con.pdf.
  • 10Effects of Neutrons on programmable logic[EB/OL].2002, http:// www.actel.com/documents/SERWP.pdf.

共引文献23

同被引文献54

引证文献6

二级引证文献19

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部