2MCDONALD C J. New tools for yield improvement inintegrated circuit manufacturing: Can they be applied to reliability?[J]. Microelectronics Reliability, 1999,39(5):731 - 739.
3Fayyad U,Uthursamy R. Evolving data mining into solutions for insights[J]. Communications of the ACM,2002,45(8):28-31.
4Fayyad U, Haussler D, Stolorz P. KDD for science data analysis: Issues and examples[A]. Proceedings of 2nd International Conference on Knowledge Discovery and Data Mining(KDD96)[C], USA: AAAI Press, 1996:50-56.
6DEDUTH H, BEATLE M.Neural network toolbox for use with MATLAB[M].Natick,MA, USA:The Math Works,Inc.,2001.
7Kim E, Kim W, Lee Y.Combination of multiple classifiers for the customer" s purchase behavior prediction [J].Decision Support Systems, 2003,34(2): 167-175.