光盘测试数据的关联分析

Relationship between Disc Testing Results

笔者在最近一次与一个光盘工厂的实验计划中,我们共同探讨有关在增加原子力显微镜之后,如何采用既有的各种测试机报告来找出一个交叉分析数据的有效程序,期待以快速的方法了解到问题的发生点,以减少停机、提升在压模制作与子盘生产中对质量的要求与降低客户的诉怨。

For involving many disc testing methods, one may not be able to understand all relationships between different measurement results. This article will present a starting point for understanding the relation between AFM pit profiles, oscilloscope eye patterns, signal parameter figures, and jitters with histogranis.