光电二极管批量快速测试系统的设计与实现

Design and Implementation of Batch Quick Testing System for Photodiodes

随着光电二极管的用量不断增大,手动测试筛选已满足不了测试需求,定制自动测试系统又存在成本较高、不易推广的缺点。为提高测试效率、解放人力资源及便于测试系统推广,采用一台KEITHLEY 2400源表及开关控制板构建了批量快速测试系统。开关控制板的阵列开关采用两片1∶8多路复用器实现,与采用继电器实现相比,降低了硬件设计难度及复杂度。将开关控制部分与器件载体部分分别设计在两块电路板上,并用两块载体板交替完成器件安装与测试,能实现器件插拔与器件测试并行进行,缩短了测试等待时间。将测试控制、参数测试及数据处理流程化,使测试效率得到了进一步提高。试验结果表明:搭建的测试系统可实现一批64只器件的一键式测试,每只器件单个参数平均测试时间不到1s,且测试准确度较高。

With the increasing use of photodiodes,manual test and screening can not satisfy the test requirements,but customized automatic testing system presents the disadvantages of high cost and not easy to spread.In order to improve test efficiency,save human resources and promote the applications of the test system,a batch rapid test system composed by a KEITHLEY2400 source and switch control circuit board was constructed.The switch array in the switch control circuit board applies two pieces of 1∶8 multiplexer,compared with the relay,it reduces the difficulty and complexity of hardware design.By designing the switch control part and the device carrier part on the two pieces of the circuit board respectively,and using two pieces of the carrier circuit board to complete the device installation and testing alternately,the device installation and device testing can be realized in parallel,thus the test waiting time is significantly shortened.With test control,parameter test and data processing streamlined,the test efficiency is further improved.The test results show that the test of 64 devices can be done by the test system with just only one-click,the average test time for one parameter is less than 1 s,and the testing accuracy is guaranteed.