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Microstructure and secondary phases in epitaxial LaBaCo_2O_(5.5 + δ) thin films

Microstructure and secondary phases in epitaxial LaBaCo_2O_(5.5 + δ) thin films
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摘要 Aberration-corrected scanning transmission electron microscopy was employed to investigate the microstructures and secondary phases in LaBaCo2O5.5+δ(LBCO) thin films grown on SrTiO3 (STO) substrates. The as-grown films showed an epitaxial growth on the substrates with atomically sharp interfaces and orientation relationships of [100]LBCO//[100]STO and (001)LBCO//(001)STO. Secondary phases were observed in the films, which strongly depended on the sample fabrication conditions. In the film prepared at a temperature of 900 ℃, nano-scale CoO pillars nucleated on the substrate, and grew along the [001] direction of the film. In the film grown at a temperature of 1000 ℃, isolated nano-scale C0304 particles appeared, which promoted the growth of {111 } twinning structures in the film. The orientation relationships and the interfaces between the secondary phases and the films were illustrated, and the growth mechanism of the film was discussed. Aberration-corrected scanning transmission electron microscopy was employed to investigate the microstructures and secondary phases in LaBaCo2O5.5+δ(LBCO) thin films grown on SrTiO3 (STO) substrates. The as-grown films showed an epitaxial growth on the substrates with atomically sharp interfaces and orientation relationships of [100]LBCO//[100]STO and (001)LBCO//(001)STO. Secondary phases were observed in the films, which strongly depended on the sample fabrication conditions. In the film prepared at a temperature of 900 ℃, nano-scale CoO pillars nucleated on the substrate, and grew along the [001] direction of the film. In the film grown at a temperature of 1000 ℃, isolated nano-scale C0304 particles appeared, which promoted the growth of {111 } twinning structures in the film. The orientation relationships and the interfaces between the secondary phases and the films were illustrated, and the growth mechanism of the film was discussed.
出处 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2018年第2期398-402,共5页 材料科学技术(英文版)
基金 financially supported by the National Natural Science Foundation of China (Nos. 51501143, 51202185 and 51390472) the National Basic Research Program of China (No. 2015CB654903) Fundamental Research Funds for the Central Universities, China Postdoctoral Science Foundation (No. 2015M572554)
关键词 Nano-structure Faceted interfaces Secondary phase growth Epitaxial thin film Microstructure Aberration-corrected scanning transmission electron microscopy Nano-structure Faceted interfaces Secondary phase growth Epitaxial thin film Microstructure Aberration-corrected scanning transmission electron microscopy
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