厚膜电阻的阻抗与驻波比频率特性的新测量方法

A Novel Measurement Method for the Impedance and SWR Frequency Characteristic of Thick Film Resistors

随着电子信息技术和移动通信技术的发展,厚膜电阻的应用越来越广泛。然而,如何准确测量厚膜电阻的阻抗和驻波比频率特性成为了一个难点。建立和分析微带线终端加载厚膜电阻的电路模型,使电阻在电路中匹配,再对应地建立终端短路的电路,最后联合求解出厚膜电阻的阻抗和驻波比频率特性。实测表明,这种测量方法是可行、准确的,对射频厚膜电阻的制造工艺和质量检测有着重要意义。

With the development of electronic information technology and mobile communication technology,thick film resistors have been more and more widely applied. However,how to accurately measure the impedance and standing wave ratio（ SWR） of the thick film resistors has become a difficult problem. A matched terminated circuit model and a corresponding short circuit model are established and analysed,with which the impedance and SWR frequency characteristics of TFR are jointly resolved. The measurement results show that the method is feasible and accurate,which has important sense for the manufacturing process and quality detection of RF thick film resistors.