显微分析技术在背光模组表面异物成分分析中的应用

Application of Micro Analysis Technique in Analysis of Composition of Foreign Substances on Surface of Backlight Module

采用扫描电子显微镜及X射线能谱仪、显微红外光谱仪、显微激光拉曼光谱仪等显微分析技术对两种液晶显示器用背光模组表面异物的成分进行了分析。通过扫描电子显微镜及X射线能谱仪观察异物的形貌及分析其元素组成,结果发现两种背光模组含有不同的异物,分别含有C、O及C、O、Si等元素;通过显微红外光谱及拉曼光谱,确定两种异物的成分分别为聚二甲基硅氧烷及聚丙烯酸酯。再结合生产实际,推测异物可能分别来源于生产涂层的原料及脱落的胶黏剂。

The composition of foreign substances on the surface of two kinds of backlight module used for liquid crystal display was analyzed by scanning electron microscopy（SEM） and X-ray energy dispersive spectrometer（EDS）, micro infrared spectroscopy（Micro-FTIR） and micro Raman spectroscopy. The SEM and EDS results show that the two kinds of backlight modules contain different foreign Substances, contain C, O and C, O, Si and other elements, respectively. By analysis of Micro-FTIR and Raman spectra, the components of the two foreign substances were identified as polydimethylsiloxane and polyacrylate, respectively. Combined analysis results with the actual production situation, it presumably that foreign bodies came from the raw materials of coating and peel off the adhesive.