高性能ADC芯片测试技术研究

The Study of High Performance ADC Testing Technology

随着集成电路技术的高速发展,高性能模数转换芯片的测试验证分析难度越来越大,通常只能在实验室里通过高性能分立仪器设备对ADC动态性能指标进行验证。本文通过介绍ADC的动态参数测试原理和方法,提出主要的测试难点。从测试硬件布局,高速采样时钟设计、滤波器使用方面进行讨论和实际验证分析,基于泰瑞达Ultra FLEX自动测试系统实现对一款12位高性能ADC性能评估。通过本论文的研究,可以为高性能ADC芯片提供基于自动化测试系统的测试解决方案。

With the development of integrated circuit technology, the verification of high-performance ADC is be- coming more and more difficult, the ADC dynamic performance test can only he verified in the laboratory through high-performance instrumentation equipment. This paper presents the main difficulties of ADC testing by introducing the lest principle and method. And from cuss, the actual use UIIraFLEX to test a for high-performance ADC. the DUT hoard layout, high-speed 12-bits ADC. Through the research, sampling clock design, BPF use to dis- can provide test solutions based on ATE