摘要
光电探测电路的设计会直接影响到光电探测系统的性能。对光电探测电路中光电二极管模型和前置跨阻放大电路进行了分析,针对光电探测电路中噪声来源,进行了详细分析并给出了其计算公式,基于实验元器件参数,计算了电路输出总噪声和信噪比。在Pspice上对前置跨阻放大电路进行了建模和仿真,分析了光电探测电路的时域特性、频域特性和噪声特性,通过参数扫描模块,分析了反馈电容对电路特性的影响,通过噪声分析模块,分析了电路噪声特性,并得到了系统等效噪声功率。
The performance of the photodetection system is directly affected by the design of the photodetection circuit？ The photodiode model and pre-transimpedance amplification circuit in the photodetection circuit were analyzed？ The source of noise in the photoelectric detection circuit is analyzed in detail and its calculation formula is given？ Based on the experimental component parameters, the circuit output total noise and signal-to-noise ratio were calculated？？ The pre-transimpedance amplifier circuit was simulated on Pspice？ The time-domain characteristics, frequency domain characteristics and noise characteristics of the photodetector circuit were analyzed？ Through the parameter scanning module, the influence of the feedback capacitance on the circuit characteristics was analyzed？ Through the noise analysis module, the circuit noise characteristics were analyzed, and the system equivalent noise power was obtained？
作者
张子儒
丁雷
张冬冬
Zhang Ziru;Ding Lei;Zhang Dongdong(University of Chinese Academy of Sciences,Beijing 100049;Shanghai Institute of Technical Physics,Shanghai ,200083;Key Laboratory of Infrared Detection and Imaging Technology,Shanghai, 200083)
出处
《电子测试》
2018年第9期8-10,共3页
Electronic Test
基金
中科院战略性先导科技专项项目(XDA15012200)
中科院上海技术物理研究所创新专项(CX-22)
