摘要
宏观内应力X射线掠入射衍射分析中,X射线折射作用引入的衍射角测定误差必然对分析产生影响。本文基于数值方法计算了Euler角定位及Hauk角定位的X射线掠入射衍射分析中因X射线折射作用引入的衍射角测定误差及其在几种宏观内应力测试方法中引入的应变测定误差。在一定角度范围内采用侧倾法可避免X射线折射作用引入的应变测定误差,而采用侧倾法及固定X射线有效穿透深度的Ψ-Ω法测试时必须对测定结果进行数据修正。
In residual stress analysis by grazing-incidence X-ray diffraction( GIXRD),the measurement error of the Bragg angle affects drastically on the analysis. In this paper,the measurement error of the diffraction angle in GIXRD in the diffraction geometries described by Euler angles and Hauk's angles and it led to measurement error of the strain in several rotation modes were calculated by numerical method.Adopting side-inclination method could avoid the error of residual stress measurement due to X-ray diffraction,while data correction should be made in the iso-inclination method and the Ψ-Ω method at fixed effective penetration depth of X ray.
作者
杜继实
唐兵华
DU Ji - shi;TANG Bing-hua(Institute of Electronic Engineering,China Academy of Engineering Physics,Mianyang 621900,China)
出处
《人工晶体学报》
EI
CAS
CSCD
北大核心
2018年第7期1450-1456,1462,共8页
Journal of Synthetic Crystals
基金
中国工程物理研究院科学发展重点基金(2014A0302012)