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一种芯片电容高精度批量测试设备设计 被引量:1

A design of high precision batch test equipment for chip capacitor
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摘要 芯片封装与测试工艺中,需对芯片电容进行测量完成合格性筛选,国内厂家目前多采用人工测试或购买国外的昂贵的电容测试设备。从应用角度出发,设计了批量自动化电容测量设备。该设备采用多路位置传感器与步进电机组成闭环控制系统,并加入安全控制与告警机制。试验表明该系统可实现芯片卷带自动、安全、可靠测试。 The chip packaging and testing process requires that the capacitance of the chip is tested and qualified,and the domestic manufacturers currently uses manual testing or foreign expensive capacitance testing equipment. This paper designs a batch automatic capacitance measuring equipment from the perspective of application. The device uses multi-position sensor and stepper motor to form a closed-loop control system,and the security control and alarm mechanism are added. The results show that the chip coil can be tested automatically,safely and reliably.
作者 刘书萌 冯国兵 王龙 陈俊凯 Liu Shumeng, Feng Guobing, Wang Long, Chen Junkai(The Sixth Research Institute of China Electronic Information Industry Group Co. ,LTD. , Beijing 102209, Chin)
出处 《信息技术与网络安全》 2018年第6期117-120,124,共5页 Information Technology and Network Security
关键词 芯片测试 高精度电容测量 流程测试 STM32F103ZET chip test high-precision capacitance measurement process testing STM32F103ZET
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