摘要
为确保碳化硅(SiC)功率器件在过载、短路等工况下能安全可靠地工作,必须充分认识SiC器件的短路机理。首先对SiC MOSFET硬开关短路故障下短路电流原理进行了分析,在此基础上对不同电路参数对SiC MOSFET短路特性的影响进行了对比分析,揭示了短路特性的关键影响因素,并对Si与SiC MOSFET短路能力和器件恶化机理进行了对比分析,从而为设计SiC MOSFET短路保护电路提供一定的指导。
To ensure the safety and reliablity of silicon carbide(SiC)power devices in the overload,short circuit and other conditions,the short circuit mechanism of SiC devices must be fully understood.Firstly,the mechanism of short-circuit current is analyzed in detail under hard-switching fault.Then,the influence of different circuit parameters on short circuit characteristics of SiC MOSFET is analyzed and compared.The key factors influencing the short-circuit characteristics are further revealed,and the short circuit capacity and device deterioration mechanism of Si and SiC MOSFET are compared and analyzed.The paper provides a guidance for designing short-circuit protection circuit of SiC MOSFET to some extent.
作者
秦海鸿
徐克峰
王丹
董耀文
赵朝会
QIN Haihong;XU Kefeng;WANG Dan;DONG Yaowen;ZHAO Chaohui(College of Automation Engineering,Nanjing University of Aeronautics & Astronautics,Nanjing,211106,China;College of Electrical Engineering,Shanghai Dian Ji University,Shanghai,201306,China)
出处
《南京航空航天大学学报》
EI
CAS
CSCD
北大核心
2018年第3期348-354,共7页
Journal of Nanjing University of Aeronautics & Astronautics
基金
国家自然科学基金(51677089)资助项目
中央高校基本科研业务费专项资金(NS2015039
NS20160047)资助项目
江苏高校优势学科建设工程资助项目
关键词
碳化硅
MOSFET
短路特性
短路保护
silicon carbide
MOSFET
short-circuit characteristics
short-circuit protection