无线芯片ADC电路自动测试平台的设计与实现

Design and Application of an Automatic Test Platform for the ADC Circuits of Wireless Chip

集成电路(IC,Integrated Circuit)作为信息产业的基础和核心,设计,测试与制造是其不可分割的几个方面。在通信领域内,模数转换器(Analog to Digital Converter,ADC)作为从模拟调制到数字基带的最后一级电路,分析和验证其性能是保证整个芯片性能的重要手段。提出一种片内ADC电路自动测试平台的设计方法,并成功应用到某款无线连接芯片ADC测试中,促进了该芯片的量产。

IC（Integrated Circuit）, as the foundation and core of information industry, has integral parts in design, testing and manufacturing. In the field of communication, Analog to Digital Converter（ADC） is the last stage circuit from analog to digital. It is an important means to analyze and verify its performance as a guarantee of the performance of the whole chip. A design method of automatic test platform for ADC in chip is proposed, and it has been successfully applied to the ADC test of a certain wireless connectivity chip, which promotes the mass production of the chip.