原子力显微镜在膜技术中的应用

Application of Atomic Force Microscope in Membrane Technology

在简要介绍原子力显微镜(AFM)的工作原理和特点的基础上,详细阐述了原子力显微镜在三维形貌观测、膜的表面粗糙度、膜的透过通量、成分分析、成膜机理研究和膜表面污染程度等方面的应用,进一步比较原子力显微镜与其他显微分析技术的不同.原子力显微镜在膜技术方面显示了强大的应用能力,由此推动膜技术的迅猛发展.同时,AFM存在一些不足,对于组成复杂的薄膜,不能获得深层次的结构和化学分析.因此,AFM需要研发更多新的分子探针,以实现对薄膜多种组分的识别和成像.

After a brief introduction to the working principle and characteristics of atomic force microscope（AFM）,the application of AFM to the observation of 3 D morphology and surface roughness of membrane,the analysis of permeation flux,composition,and the formation mechanism of membrane as well as the degree of membrane surface fouling were discussed. The differences between AFM and other microanalysis techniques were further compared. The results show that AFM has greatly facilitated the study of membrane and thus promoted the rapid development of membrane technology. At the same time,AFM has some shortcomings. For example,it cannot be used for deep structural and chemical analysis of complex membranes. Therefore,we need to develop more new molecular probes to realize the recognition and imaging of various components of the membrane.