摘要
随机数在密码系统中起着至关重要的作用。一个有缺陷的随机数序列,可能会导致整个密码系统被攻击者攻破。因此,测试随机数的随机性是非常重要的环节。具体地,介绍美国NIST公布的SP 800-22随机数测试标准,通过同时计算多个比特数据、优化统计测试公式和降低计算复杂度等方法,对其中的部分测试项进行了基于C语言的快速实现。测试结果表明,采用该快速实现方法能显著提升随机数测试速率。
Random numbers play a crucial role in the cryptosystem. A defective random-number sequence may cause the entire cryptosystem to be compromised by an attacker. Therefore, testing on the randomness of random numbers is a very important link. The SP 800-22 random-number test standard published by NIST in the United States is introduced. Through simultaneously calculating multiple bit data, optimizing the statistical test formulas and reducing computational complexity, C language-based quick implementation of some test items is done. The test results indicate that the fast implementation method could significantly improve the random-number test rate.
作者
段俊红
韩炼冰
房利国
DUAN Jun-hong;HAN Lian-bing;FANG Li-guo(No.30 Institute of CETC,Chengdu Sichuan 610041,China)
出处
《通信技术》
2018年第8期1940-1944,共5页
Communications Technology