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配电开关引起的智能微电网事故跳闸原因分析与处理 被引量:1

Cause Analysis and Treatment of Intelligent Microgrid Trip Caused by Distribution Switch
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摘要 云南某智能微电网项目在投产过程中由于配电开关参数设计不当而引起了事故跳闸,本文对该事故跳闸的可能原因进行了分析、总结,并提出了相应的改进措施,同时,通过试验验证了应对措施的可行性。 Due to the improper design of distribution switch parameters,a fault trip occurred in an intelligent microgird project in Yunnan during production.This paper analyzes and summarizes the possible causes of the trip,and puts forward corresponding improvement measures.At the same time,the feasibility of the countermeasures is verified through experiments.
作者 董玉杰 任妮 王家陈 DONG Yujie;REN Ni;WANG Jiachen(Yunnan Electric Power Technology Co.,Ltd.,Kunming 650217,China)
出处 《电工技术》 2018年第12期29-30,共2页 Electric Engineering
关键词 智能微电网 配电开关 事故跳闸 intelligent micro-grid distribution switch fault trip
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