摘要
本文介绍了全电波暗室的性能测试技术,并结合其实际测试中出现的问题,提出了相应的解决方案,为有关需要提供参考。
In this paper, the performance testing technology of the full electric wave chamber is introduced, and the corresponding solutions are put forward in combination with the problems in the actual test, which can provide reference for the relevant needs.
作者
杜渝
Du Yu(Kell laboratory,China Electronic Technology Group Corporation Seventh Research Institute,Guangzhou Guangdong,510000)
出处
《电子测试》
2018年第13期131-133,共3页
Electronic Test
关键词
全电波暗室
性能测试
技术
all anechoic chamber
performance testing
Technology
