用于识别面阵探测器相连缺陷元的新型光学滤光片（英文）

Novel optical filter to identify the connected defective elements in focal plane array

相连缺陷元识别一直是面阵探测器研究难点。面阵探测器相连缺陷元的光电信号与正常元基本相同,因此采用现有面阵测试方法无法识别相连缺陷元。提出了一种新型光学滤光片来识别面阵探测器中的相连缺陷元。在提出的滤光片结构中,有两种不同透光率、且交错排列的阵列组成。采用该滤光片后,相连缺陷元的响应电压值是正常单元响应电压的50%,面阵探测器相连缺陷元可以被显著识别。

The connected defective elements identifications has always been the research difficulty of focal plane array（FPA） detector. It is difficult to identify connected defective elements by FPA test-bench because the response voltage of connected defective elements is basically the same as that of normal elements. Novel optical filter for connected defective elements identifications was proposed. The presented filter had sorted elements of FPA detector into two kinds of detection units. The two kinds of detection units were designed in pairs and staggered arrangement closed to each other. The response voltage of the connected defective elements was 50% of that of normal elements. The connected defective elements were identified markedly by using the proposed filter.