低温取向硅钢初次再结晶织构及晶界特征分析

Analysis of primary recrystallization texture and grain boundary character distributions of low temperature grain-oriented silicon steel

应用EBSD技术对低温取向硅钢初次再结晶样品表层、次表层及中心层微观组织进行了研究并基于HE与CSL晶界理论对各层的晶界特征分布进行了分析。结果表明：各层初次再结晶织构以γ织构及{114}〈418〉织构为主,Goss晶粒主要分布在表层与次表层,平均晶粒尺寸由表层至中心层逐渐减小。基体与Goss晶粒取向差分布主要集中在能构成高能晶界关系的20°~45°间,并且次表层所占比例最高。基体中CSL晶界类型以∑3为主,在Goss晶粒周围分布着极少量的∑5、∑7、∑9晶界。

In surface,sub-surface and center layer of low temperature grain-oriented silicon steel,the primary recrystallization texture and GBCD（Grain Boundary Character Distributions）based on HE（High Energy）and CSL（Coincidence Site Lattice）grain boundary theories were studied by EBSD（Electron Backscattered Diffraction）.The results show that the primary recrystallization textures are mainlyγfiber and {114}〈418〉texture.Goss grains are mainly distributed on the surface and subsurface layer and the average grain size decreases gradually from the surface to the central layer.The misorientation distribution between the matrix and the Goss grains is mainly concentrated in the 20°-45°which can form the high energy grain boundary,and the Goss grains in the sub-surface layer has the highest proportion of misorientation in 20°-45°.The type of CSL grain boundary is mainly∑3 and a little∑5,∑7,∑9 boundaries could be found in matrix.