摘要
本文将对其静电产生的理念尤其是半导体器件的静电破坏模式先作阐述,并重点对新型数字隔离技术在静电放电保护中的应用与通过静电电位传感器“EP传感器”及多种技术装置在静电放电保护中应用的举措作重点研讨。与此同时,也着重对数字隔离器的正确放置对其芯片损害的保护问题作分析。
this paper takes the concept of the electrostatic generation especially static failure mode for this first semiconductor devices, and focus on the new digital isolation technology in the application of electrostatic discharge protection and by electrostatic potential sensor EP sensors and a variety of technical equipment in the applications of electrostatic discharge protection measures for the key discussion. At the same time, the protection of the digital isolator to the chip damage is analyzed.
出处
《磁性元件与电源》
2018年第8期146-150,156,共6页
Components and Power