摘要
本文用GEANT4软件分析了X射线管中两种X荧光测量结构的特征。先对X射线管作了模拟,后针对轻基质低重元素含量的样品分析,构建了两种X荧光测量的几何结构模型,得出两种测量结构的散射背景几乎一样,但在被分析元素的特征X荧光数占X射线总数的比值上,竖直入射结构总大于45度入射结构。这些结果可为用X射线管进行实际样品测量提供一定的工作基础。
This paper mainly analyzes the effects of x-ray spectrum casued by two XRF measurement structures used by GEANT4.The x-ray tube was simulated by GEANT4, then on the basis of the analysis of the samples with light substrate and low content of heavy elements, two geometry models of the X fluorescence measurement were constructed. The conclusions are the scattering background of two structure measurements is almost the same, but in analysis of the ratio of the number of X-ray fluorescence to the total number of X-ray, the vertical incidence measurement structure is always greater than the 45-degree incidence measurement structure. The results can provide the basis for the actual sample measurement with x-ray tube.
作者
杨悦
Yang Yue(School of Nuclear Science and Engineering,East China University of Technology,Nanchang 330013,China)
出处
《广东化工》
CAS
2018年第15期16-17,共2页
Guangdong Chemical Industry
