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Two-frequency amplification in a semiconductor tapered amplifier for cold atom experiments

Two-frequency amplification in a semiconductor tapered amplifier for cold atom experiments
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摘要 Simultaneous two-frequency amplification is highly desirable in cold atom experiments. The nonlinear response would appear in the two-frequency amplification with a semiconductor tapered amplifier(TA) and has a direct influence on the experimental result. We investigated in detail the effects of frequency difference, total power, and power ratio of two seeding lasers on the output components based on a simplified theoretical model. The simulation results showed that the multiple sideband generation in the amplifier due to self-phase and amplitude modulation could be suppressed and the TA tended to linearly amplify the power ratio between two-frequency components, when the two seeding lasers had a large frequency difference. This was verified experimentally in the output power ratio measurement via a calibrated Fabry-Perot interferometer method with a good linearity and an uncertainty of 1%. We also discussed the consequences of power ratio responses in the amplification in light of cold atom experiments, especially in the ac Stark shift related phase error of Raman-type atom interferometers(AIs). It was shown that the fluctuation of intensity ratio of Raman beams may induce significant systematic errors for an AI gyroscope. Simultaneous two-frequency amplification is highly desirable in cold atom experiments. The nonlinear response would appear in the two-frequency amplification with a semiconductor tapered amplifier(TA) and has a direct influence on the experimental result. We investigated in detail the effects of frequency difference, total power, and power ratio of two seeding lasers on the output components based on a simplified theoretical model. The simulation results showed that the multiple sideband generation in the amplifier due to self-phase and amplitude modulation could be suppressed and the TA tended to linearly amplify the power ratio between two-frequency components, when the two seeding lasers had a large frequency difference. This was verified experimentally in the output power ratio measurement via a calibrated Fabry-Perot interferometer method with a good linearity and an uncertainty of 1%. We also discussed the consequences of power ratio responses in the amplification in light of cold atom experiments, especially in the ac Stark shift related phase error of Raman-type atom interferometers(AIs). It was shown that the fluctuation of intensity ratio of Raman beams may induce significant systematic errors for an AI gyroscope.
作者 Zhi-Xin Meng Yu-Hang Li and Yan-Ying Feng 孟至欣;李宇航;冯焱颖(State Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments, Tsinghua University)
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第9期270-276,共7页 中国物理B(英文版)
基金 Project supported by the National Natural Science Foundation of China(Grant No.61473166)
关键词 two-frequency amplification self-phase modulation laser cooling atom interferometry two-frequency amplification self-phase modulation laser cooling atom interferometry
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